Bettersizer S3 - Laser Diffraction Particle Size
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Particle size and shape analysis 0.01 – 3,500 µm.
With its unique and innovative design, the Bettersizer Series (consisting of the Bettersizer S3 and the S3 Plus) combines the measurement methods of static light scattering and dynamic image analysis, thus offering a universal option for characterizing the size and shape of particles from the nanometre to the millimetre range.
Using the patented DLOIOS technology, even nanoparticles (from 10 nm onward) can reliably be characterized. The additional lens between the laser and the measurement chamber enables the detection of the backscattered light. The use of only one laser with the oblique incidence of light provides a continuous scattering spectrum with consistent wavelength and allows the detection in a continuous angle range up to 165°.
Since the maximal intensity of the scattered light of large particles can only be detected at very small angles, the classical static light scattering cannot analyse those particles sufficiently enough. The image analysis system of the Bettersizer S3 Plus enables, in contrast to other laser diffraction systems, the reliable detection of larger particles thanks to particle detection by the camera and thus allows realistic measurements up to 3.5 mm.
Thanks to the implemented dynamic image analysis, the most important shape parameters can be calculated from the individual particle images – aspect ratio, circularity, sharpness of edges, and others.
The shape analysis can be carried out simultaneously with the size analysis or independently. Thereby you can choose between two magnifications for image collection (Bettersizer S3 Plus: 0.5X and 10X).
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