Press Release: Ball contact test probe handles lateral stresses
23 June 2008
New design of probes for print circuit testing
The new P945 and P946 solder-mounted probes from Peak Test Services are based on a new design that uses a ball for the contact area.
The new probes are particularly suited to applications in printed-circuit-board testing that involve lateral stress on the test probe. They can be used as contact elements in reading heads of different sizes or as contact elements on slip rings.
The P945 is a very compact sized unit with a total length of 11.0 mm including the connector pin and a very low spring travel of 0.4 mm. The P946 has an overall length of 12.3 mm and a spring travel of 1.2 mm. Both devices are easy to install.
The P945 and P946 probes are available in the
Other Press Releases By This Company
- 19/08/2008 - The Pushback test Probe for Connector Testing
- 19/08/2008 - The Screw-in Probe for Push Back Testing
- 14/07/2008 - Peak Test Services introduces a new series of switch probe – the P200/G series
- 09/07/2008 - Ultra-Short Threaded Test Probe for 2.54mm Centres
- 10/10/2007 - New Teast Probe catalogue launch
